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Noise, Transport and Structural Properties of High Energy Radiation Detectors Based on CdTe
Šik, Ondřej ; Lazar, Josef (referee) ; Navrátil, Vladislav (referee) ; Grmela, Lubomír (advisor)
Poptávka ze strany vesmírného výzkumu, zdravotnictví a bezpečnostního průmyslu způsobila v posledních letech zvýšený zájem o vývoj materiálů pro detekci a zobrazování vysokoenergetického záření. CdTe a jeho slitina CdZnTe. jsou polovodiče umožnují detekci záření o energiích v rozsahu 10 keV až 500 keV. Šířka zakázaného pásma u CdTe / CdZnTe je 1.46 -1.6 eV, což umožňuje produkci krystalů o vysoké rezistivitě (10^10-10^11 cm), která je dostačující pro použití CdTe / CdZnTe při pokojové teplotě. V mé práci byly zkoumány detektory CdTe/CdZnTe v různých stádiích jejich poruchovosti. Byly použity velmi kvalitní spektroskopické detektory, materiál s nižší rezistivitou a výraznou polarizací, detektory s asymetrií elektrických parametrů kontaktů a teplotně degenerované vzorky. Z výsledků analýzy nízkofrekvenčního šumu je patrný obecný závěr, že zvýšená koncentrace defektů způsobí změnu povahy původně monotónního spektra typu 1/f na spektrum s výrazným vlivem generačně-rekombinačních procesů. Další výrazná vlastnost degenerovaných detektorů a detektorů nižší kvality je nárůst spektrální hustoty šumu typu 1/f se vzrůstajícím napájecím napětí se směrnicí výrazně vyšší než 2. Strukturální a chemické analýzy poukázaly, že teplotní generace detektorů způsobuje difuzi kovu použitého při kontaktování a stopových prvků hlouběji do objemu krystalu. Část mé práce je věnována modifikaci povrchu svazkem argonových iontů a jejímu vlivu na chemické složení a morfologii povrchu.
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Study of CdTe sensor properties
Vašíček, Martin ; Holcman, Vladimír (referee) ; Grmela, Lubomír (advisor)
This Bachelor Thesis is focused on studies of CdTe detector characteristics. It is to describe the analysis of transport and noise characteristics of CdTe samples at different temperatures. Evaluation of our results proves that CdTe junction behaves like an antiseries connection of a pair of diodes. The courses of VA characteristics are noted for linear or slightly exponential growth. When temperature is growing , conductivity of the samples is growing too. Our measurements demonstrated difference in conductivity of samples tested at the same temperature. It is also obvious that within very low range of frequencies the factor of noise 1/f is dominating. From 10Hz frequency the effect of thermal noise prevails.
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The Noise Spectroscopy of Radiation Detectors Based on the CdTe
Zajaček, Jiří ; Štourač, Ladislav (referee) ; Hájek, Karel (referee) ; Grmela, Lubomír (advisor)
The main object of this work is noise spectroscopy of CdTe radiation detectors (-rays and X–rays) and CdTe samples. The study of stochastic phenomenon and tracing redundant low-frequency noise in semiconductor materials require long-term measurements in time domain and evaluate suitable power spectral densities (PSD) with logarithmic divided frequency axes. We have used the means of time-frequency analysis derived from the discrete wavelet transform (DWT) and we have designed the effective algorithm for PSD estimation, which is comparable with an original analog method. CdTe single crystal with Au contacts we can imagine as a series connection of two Schottky diodes with a resistor between them. The bulk resistance at constant temperature and other constant parameters changes due to the carrier concentration changing only. The p-type CdTe sample shows metal behavior with every temperature changes. Semiconductor properties of the sample begin to dominate just after some period of time. This behavior is caused by the hole mobility changing. The voltage noise spectral density of 1/f noise depends on the quantity of free carriers in the sample. All the studied samples have very high value of low frequency noise, much higher than it should have been according to Hooge’s formula. The excess value of low frequency noise is caused by the low carrier concentration within the depleted region.
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Structural defects in II-VI semiconductors
Šedivý, Lukáš ; Belas, Eduard (advisor)
Title: Structural defects in II-VI semiconductors Author: Lukáš Šedivý Department: Institute of Physics of Charles University Supervisor: Doc. Ing. Eduard Belas, CSc., Institute of Physics, Faculty of Mathematics and Physics, Charles University Abstract: The single crystalline CdTe doped by chlorine is an excellent material for man- ufacturing x-ray and gamma-ray room-temperature semiconductor detectors thanks to the large linear attenuation coefficient, the possibility to make it high-resistive at the room temperature, and good electron mobility and the lifetime. This thesis aimed to examine the effect of annealing in well-defined ambient component pressure, Cd or Te, on the crys- tal's defect structure. The first experimental is devoted to eliminating the second phase defects - inclusions - present in CdTe : Cl, which significantly decay the crystal quality and detection performance. The following experimental parts are focused on the detailed inves- tigation of the point defect structure of CdTe : Cl. The annealing interval bisection method for reaching high resistivity material is introduced. The equilibrium defect structure is in- vestigated using the in-situ high-temperature Hall effect measurements. The results are interpreted through an advanced model of the defect structure considering also dissocia-...
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Photo-Hall effect spectroscopy and laser-induced transient currents in CdTe-based semiconductor radiation detectors
Musiienko, Artem ; Grill, Roman (advisor) ; Dubecký, František (referee) ; Oswald, Jiří (referee)
Title: Photo-Hall effect spectroscopy and laser-induced transient currents in CdTe-based semiconductor radiation detectors Author: Artem Musiienko Department / Institute: Institute of Physics, Faculty of Mathematics and Physics, Charles University Supervisor of the doctoral thesis: Prof. RNDr. Roman Grill, CSc, Institute of Physics, Faculty of Mathematics and Physics, Charles University Abstract: Cadmium Telluride, Cadmium Zinc Telluride, and Cadmium Manganese Telluride are important semiconductors with applications in radiation detection, solar cells, and electro-optic modulators. Their electrical and optical properties are principally controlled by defects forming energy levels within the bandgap. Such defects create recombination and trapping centers capturing photo- created carriers and depreciating the performance of the detector. Simultaneously, the changed occupancy of levels leads to the charging of detector's bulk, which results in the screening of applied bias and the loss of detector's sensitivity. Detailed knowledge of crystal defect structure is thus necessary for the predictable detector work and also for the possibility to reduce the structural defects concentration. This thesis reports on the investigation of deep energy levels in CdTe-based high resistivity and detector-grade materials by...
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Electromigration of defects in (CdZn)Te single crystals.
Pekárek, Jakub ; Belas, Eduard (advisor) ; Grill, Roman (referee)
In the present work we study effect of electromigration of defects in CdTe material in external electric field at various temperatures and biases. The aim was to verify this effect using a set of electric contacts arranged linearly along the sample. These contacts as a potential probes was used for the detection of the drift of the local resistance modulation. We try to determine under what conditions and why it happens and then decide how this effect can be used for purification of semi-conducting samples and for preparation of semi-insulating material.
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Photoluminescence of CdTe crystals
Procházka, Jan ; Hlídek, Pavel (advisor) ; Toušek, Jiří (referee) ; Oswald, Jiří (referee)
Title: Photoluminescence of CdTe crystals Author: Jan Procházka Department: Institute of Physics of Charles University in Prague Supervisor: Doc. RNDr. Pavel Hlídek, CSc. Abstract: Energy levels connected with defects in nominally undoped crystals CdTe, indium- doped crystals and chlorine-doped crystals were studied using low-temperature photoluminescence. The crystals are intended for X- and gamma- ray detectors operated at room temperature. An effect of annealing in cadmium or tellurium vapor on luminescence spectra was investigated. Some changes were interpreted by filling of vacancies not only by atoms coming from gaseous phase but also by impurities from defects like interstitials, precipitates, inclusions, grain boundaries etc. The luminescence bands assigned to defects important for compensation mechanism were examined, namely A-centers (complexes of vacancy in cadmium sublattice and impurity shallow donor) and complexes of two donors bound to a vacancy. It was shown, that temperature dependence of the luminescence bands results from more complicated processes than a simple thermal escape of bound excitons or thermal excitation of electrons (holes) from defects to bands. We observed expressive "selective pair luminescence" bands (SPL) on partially compensated In-doped samples during sub-gap...
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Centra rekombinace v semiizolačním CdTe
Zázvorka, Jakub ; Franc, Jan (advisor) ; Fiederle, Michael (referee)
Title: Recombination centers in semiinsulating CdTe Author: Jakub Zázvorka Department / Institute: Institute of Physics of Charles University Supervisor of the master thesis: prof. Ing. Jan Franc, DrSc., Institute of Physics of Charles University Abstract: The properties of CdTe for application as a radiation detector are influenced through the presence of deep levels in the bang gap. These energy levels complicate the charge collection and the detector efficiency. Contactless resistivity mapping (COREMA) represents a good option for material characterization without the necessity of metal contacts application. The time-dependent charge measurement was investigated on an adjusted apparatus in FMF Freiburg. Theoretical model of charge transport based on band bending on the sample surface was proposed and a non-exponential behavior was calculated. Using this, the resulted parameter tendencies and their connection with deep level trap or recombination center were explained. A correlation was observed between resistivity, photoconductivity and a near midgap level photoluminescence. Parameter profiles were explained using the theory of Fermi level shift relative to the near midgap level. Three deep levels were observed on samples grown at the Charles University in Prague. Their photoluminescence supports the...
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Structural defects in II-VI semiconductors
Šedivý, Lukáš ; Belas, Eduard (advisor) ; Hulicius, Eduard (referee) ; Schneeweiss, Oldřich (referee)
Title: Structural defects in II-VI semiconductors Author: Lukáš Šedivý Department: Institute of Physics of Charles University Supervisor: Doc. Ing. Eduard Belas, CSc., Institute of Physics, Faculty of Mathematics and Physics, Charles University Abstract: The single crystalline CdTe doped by chlorine is an excellent material for man- ufacturing x-ray and gamma-ray room-temperature semiconductor detectors thanks to the large linear attenuation coefficient, the possibility to make it high-resistive at the room temperature, and good electron mobility and the lifetime. This thesis aimed to examine the effect of annealing in well-defined ambient component pressure, Cd or Te, on the crys- tal's defect structure. The first experimental is devoted to eliminating the second phase defects - inclusions - present in CdTe : Cl, which significantly decay the crystal quality and detection performance. The following experimental parts are focused on the detailed inves- tigation of the point defect structure of CdTe : Cl. The annealing interval bisection method for reaching high resistivity material is introduced. The equilibrium defect structure is in- vestigated using the in-situ high-temperature Hall effect measurements. The results are interpreted through an advanced model of the defect structure considering also dissocia-...
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